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Issue title: 14th International Workshop on 1&2 Dimensional Magnetic Measurement and Testing (2016)
Guest editors: Zhiguang Cheng, Jianguo Zhu, Yongjian Li and Johannes Sievert
Article type: Research Article
Authors: Ripka, Pavel* | Vyhnánek, Jan | Chirtsov, Andrey
Affiliations: Faculty of Electrical Engineering, Czech Technical University, Technicka 2, Czech Republic
Correspondence: [*] Corresponding author: Pavel Ripka, Faculty of Electrical Engineering, Czech Technical University, Technicka 2, 166 27 Praha 6, Czech Republic. Tel.: +420 736 760 601; E-mail: [email protected].
Abstract: Magnetic sensors used for non-destructive testing, metal detection and other applications are subjected to large perpendicular field. In this paper we show that the existing models describing the response of anisotropic magnetoresistors (AMR) cannot be used for fields larger than the critical value, which is 350 μT for the Honeywell HMC1001. This critical value is one order of magnitude lower than the anisotropy field and it is decreasing with increased value of the measured field. From our findings it is clear that AMR sensors cannot be safely used in applications in which fields above 250 μT can appear. Neither flipping, nor feedback compensation can compensate for this error. We show that this behaviour is caused by the fact that the single-domain state of the AMR is broken at the mentioned critical field. Compared to that, fluxgate sensors including microfluxgates are by principle immune against the crossfield. Unlike in AMR, crossfield sensitivity in fluxgate sensors is second-order effect, which can be kept under control by proper design. We show that even crossfield of 10 mT does not cause significant degradation of the sensor precision.
Keywords: Magnetic sensors, crossfield sensitivity
DOI: 10.3233/JAE-172256
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 55, no. S1, pp. 39-47, 2017
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