Affiliations: [a] Graduate School of System Informatics, Kobe University, Kobe, Japan | [b] Center for Research in Scientific Computation, North Carolina State University, Raleigh, NC, USA
Correspondence:
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Corresponding author: Fumio Kojima, Graduate School of System Informatics, Kobe University, 1-1, Rokkodai-cho, Nada-ku, Kobe 657-8501, Japan. E-mail:[email protected]
Abstract: This paper is concerned with material interrogation methods for homogeneous dielectric materials using statistical inversion.
Frequency dispersions for homogeneous dielectric materials can be described by a classical Lorentz model.
Taking into account that the reflection coefficients are indirectly measurable, the
signal response model is given by a complex reflectance at the interface
between free space and the dielectric medium.
The problem considered here is to quantify uncertainties of the estimated dielectric parameters
from the measurements obtained by a reflective interferometer.
A computational method using Hamiltonian Monte Carlo sampling based on nonlinear hierarchical models is tested.
