Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Zhang, Wenguang* | Ma, Yakun | Li, Zhengwei
Affiliations: State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, China
Correspondence: [*] Corresponding author: Wenguang Zhang, State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai 200240, China. Tel.: +86 21 34204851; E-mail:[email protected]
Abstract: Brain micromotion is one of the key factors that influence the longevity of neural probes. In order to improve the long-term stability of brain implanted electrodes, finite element (FE) models, utilizing hyper-viscoelastic constitutive equations, are developed to conduct a series of dynamic analysis of the neural probe-brain model. The influences of neural probe geometry parameters (e.g. tip fillet, wedge angle, wall thickness) on micromotion induced brain injury are investigated. The results show that fillet radius of 20 micrometers keeps both the maximum strain and injury zone in a small region while wedge angle of 70 degree leads to a 10.34% reduction in strain and 34.52% reduction in injury zone. Wall thickness of 15 micrometers generates the minimal injury zone and should be minimized under the condition of probe strength. The results will provide guidance on the development of novel neural probes with long-term stability.
Keywords: Micromotion, neural probe, geometry parameter, finite element
DOI: 10.3233/JAE-162178
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 1-2, pp. 471-477, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]