Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Safdarnejad, S. Morteza* | Su, Zhiyi | Ye, Chaofeng | Udpa, Lalita | Udpa, Satish
Affiliations: Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA
Correspondence: [*] Corresponding author: S. Morteza Safdarnejad, Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48910, USA. E-mail:[email protected]
Abstract: EC-GMR measurements have been applied for detection of sub-surface corrosion and cracks under fastener (CUF) head. Generally, fastener signal amplitude is larger than the amplitude of the crack signal indication, rendering crack detection a challenging task. Also, another challenge in the analysis of field signals is the stitching problem, commonly present in a raster scan of a row of fasteners. We propose a method based on robust sparse coding (RSC) representation to alleviate the stitching problem and enhance defect detection capability. For the dictionary, we simulate multi-layer geometries using finite element (FE) modeling. Results on simulated and field data demonstrate the feasibility and robustness of the proposed algorithm.
Keywords: EC-GMR, crack under fastener, sparse coding
DOI: 10.3233/JAE-162109
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 1-2, pp. 415-423, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]