Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Selected papers from the International Symposium on Applied Electromagnetics and Mechanics - ISEM 2019
Guest editors: Jinhao Qiu, Ke Xiong and Hongli Ji
Article type: Research Article
Authors: Wang, Lihuia; | Zhao, Kaia | Zhang, Wenpenga | Liu, Jianb | Pang, Fubinb
Affiliations: [a] Key Laboratory of Micro-inertial Instrument and Advanced Navigation Technology, Ministry of Education, School of Instrument Science and Engineering, Southeast University, Nanjing, China | [b] State Grid Jiangsu Electrical Power Company Research Institute, Nanjing, China
Correspondence: [*] Corresponding author: Lihui Wang, Key Laboratory of Micro-inertial Instrument and Advanced Navigation Technology, Ministry of Education, School of Instrument Science and Engineering, Southeast University, Nanjing 210096, China. E-mail: [email protected]
Abstract: Affected by environmental factors, the performance of fiber optic current transformer (FOCT) will deteriorate over a long period of time. Intelligent fault diagnosis algorithm of Long-Short Term Memory (LSTM) combing with Support Vector Machine (SVM) is an effective way to deal with FOCT failures. According to the characteristics of LSTM, a signal prediction model in FOCT based on LSTM is proposed by analyzing the historical data. The residual signal can be obtained by the prediction signal and the observed signal. Set the residual threshold to determine whether the FOCT has fault. With the residual signal characteristics, a fault diagnosis model based on SVM is established. By analyzing the residual signal and extracting features, the diagnostic network can realize the pattern recognition and system fault diagnosis. Experiments demonstrate that the drift deviation fault, the ratio deviation fault and the fixed deviation fault can be diagnosed with an accuracy of 94.5%.
Keywords: Fiber optic current transformer, fault feature, fault diagnosis, long-short term memory
DOI: 10.3233/JAE-209301
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 64, no. 1-4, pp. 3-10, 2020
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]