Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Xu, Jianga; | Chen, Guanga | Zhou, Jinhaia | Li, Yonga
Affiliations: [a] School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, P.R. China
Correspondence: [*] Corresponding author: Jiang Xu, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, Hubei, China. Tel.: +862787559332; Fax: +862787559332; E-mail: [email protected]
Abstract: Recently, some researchers found that there was a notchfrequency phenomenon when the guided wave propagated in the pre-stressing strand under tension. The notch frequency has a linear relationship with the logarithm of tension. According to their results, a force measurement method for the strand was proposed. However, fatigue damage is often encountered inservice strands. In this paper, we study the effect of fatigue damage on the notch frequency of the pre-stressing strand under tension based on the magnetostrictive guided wave technology. The relationship between the cyclic loading times and the notch frequencies under the same tension is obtained from four pre-stressing strands. The results show that the notch frequencies are variable with the cyclic loading times. At first, the notch frequency increases slightly, then decreases suddenly, and then increases almost linearly with increasing of the cyclic loading times. Our research indicates that the tension measurement method by using the notch frequency for strands should consider the effect of the fatigue damage. Moreover, the notch frequency can also be employed to evaluate the fatigue damage of strands after 1.85 million cyclic loading times.
Keywords: Notch frequency, fatigue damage, pre-stressing strand, guided wave, magnetostrictive effect
DOI: 10.3233/JAE-171109
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 59, no. 4, pp. 1341-1348, 2019
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]