Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Chen, Junjiea | Huang, Songlinga; * | Zhao, Weia
Affiliations: [a] State Key Laboratory of Power System and Department of Electrical Engineering, Tsinghua University, Beijing, China
Correspondence: [*] Corresponding author: Songling Huang, State Key Laboratory of Power System and Department of Electrical Engineering, Tsinghua University, Beijing 100084, China. Tel.: +86 010 6277 2131; Fax: +86 010 6277 2131; E-mail: [email protected]
Abstract: In this paper, we propose an equivalent forward model of magnetic flux leakage (MFL) inspection in pipelines to reduce the computation effort to predict MFL signals. Then an iterative simulated annealing inversion procedure is developed to reconstruct the three-dimensional (3-D) defect profile from MFL signals. Experiments results, based on both simulated and measured MFL signals, demonstrate that the proposed inversion procedure using the equivalent forward model has high performance in terms of execution speed and accuracy.
Keywords: Magnetic flux leakage, equivalent model, defect reconstruction, pipeline inspection, simulated annealing algorithm
DOI: 10.3233/JAE-140022
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 47, no. 2, pp. 551-561, 2015
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]