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Article type: Research Article
Authors: Xu, Ming-Xiua | Chen, Zhang-Huaa | Xu, Min-Qiangb; * | You, Tian-Qingc
Affiliations: [a] School of Mathematics and Physics, University of Science and Technology Beijing, Beijing, China | [b] Division of Vehicle Dynamics and Control, Harbin Institute of Technology, Harbin, Heilongjiang, China | [c] Beijing Institute of Astronautics System Engineering, Beijing, China
Correspondence: [*] Corresponding author: Ming-Xiu Xu, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, China. Tel.: +86 159 107 989 66; E-mail: [email protected]
Abstract: In metal magnetic memory (MMM) detection, the Jiles-Atherton model describes material magnetization caused by the geomagnetic field and cyclic stress. However, characterization of the effects of fatigue damage on magnetization remains an issue. In this paper, an expression for magnetization intensity M_{0} related to dislocation and plastic strain amplitude ε_{p} was incorporated into a modified Jiles-Atherton model. To validate the M_{0} expression, standard tensile fatigue tests were performed. Results indicate that the domain wall pinning parameter k_{1} in M_{0} is linear in both dislocation density ρ and average dislocations slippage distance �λ, as is also the shear plastic strain amplitude in the stress control fatigue. The stress amplitude in strain control fatigue however is linear with respect to ρ^{1/2} . Therefore, M_{0} can be expressed as a function of stress and ε_{p} (or �λ and stress amplitude). Experiments showed that calculated M_{0} variations in fatigue development processes can reflect a variation law in the MMM signal, with certain differences. There is a numerical difference between H_{px} and M_{0} because the surface magnetic field is much weaker than that within the ferromagnetic material. H_{px} increases after macro crack initiation caused by an additional material demagnetization field and a leakage field near the crack during cracking.
Keywords: Fatigue, metal magnetic memory, Jiles-Atherton model, dislocations
DOI: 10.3233/JAE-130159
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 47, no. 1, pp. 61-73, 2015
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