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Issue title: Proceedings from the 16th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2013)
Guest editors: Xavier Maldague and Toshiyuki Takagi
Article type: Research Article
Authors: Zhu, Haitaoa; * | Demachi, Kazuyukib | Wu, Wenjingb | Sekino, Masakic
Affiliations: [a] Centre for Technology R and D, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China | [b] Department of Nuclear Engineering, The University of Tokyo, Tokyo, Japan | [c] Department of Electrical Engineering, The University of Tokyo, Tokyo, Japan | Université Laval, Canada | Tohoku University, Japan
Correspondence: [*] Corresponding author: Haitao Zhu, Centre for Technology R and D, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China. E-mail: [email protected]
Abstract: Magnetic susceptibility is the inherent property of materials. Magnetic resonance imaging as a kind of non-invasive testing technique may measure the magnetic field distortion induced by the imaging object and consequently calculate its magnetic susceptibility distribution. Conventionally, magnetic susceptibility mapping is performed in three-dimensional mode with the requirement of multi-slice scanning. In the condition of long objects that have uniform distribution along one direction, two-dimensional phase image of the cross section might be enough to estimate the susceptibility. In this study, we adjust susceptibility mapping algorithm into a two-dimensional mode and evaluate the possibility of using a single-slice image to estimate the magnetic susceptibility. Simulation was performed to validate the algorithm in both ideal and noise-imposed conditions. MRI experiment was performed by using copper, graphite and iron oxide at different concentrations. The results suggest that it is possible to measure the susceptibility of a long object by a two-dimensional image.
Keywords: Magnetic resonance imaging, susceptibility mapping, phase image
DOI: 10.3233/JAE-141911
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 45, no. 1-4, pp. 817-823, 2014
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