Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 16th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2013)
Guest editors: Xavier Maldague and Toshiyuki Takagi
Article type: Research Article
Authors: Faktorová, Dagmara
Affiliations: [a] Department of Measurement and Applied Electrical Engineering, Faculty of Electrical Engineering, University of Žilina, Univerzitná 1010 26 Žilina, Slovak Republic. E-mail: [email protected] | Université Laval, Canada | Tohoku University, Japan
Abstract: The paper deals with some methods for relative permittivity of dielectric materials measurement and with the relevant techniques. In addition to current methods of measurement evaluation on vector network analyser our new approach gives also information about possibility of the use of classical methods for evaluation of application at vector network analyser as a faster source of basis for computations. In the paper also an attention to a situation is paid when it is problematical to determine the unknown permittivity of solid material by usual methods.
Keywords: Microwave frequencies, relative permittivity, scattering parameters
DOI: 10.3233/JAE-141909
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 45, no. 1-4, pp. 801-807, 2014
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]