Frequency-domain defect characterization in pulsed eddy current testing

Issue title: Proceedings from the 16th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2013)

Guest editors: Xavier Maldague and Toshiyuki Takagi

Article type: Research Article

Authors: Zeng, Zhiwei^{a; *} | Li, Yansong^a | Huang, Lin^a | Luo, Minfang^a

Affiliations: [a] Department of Aeronautics, Xiamen University, Xiamen, Fujian, China | Université Laval, Canada | Tohoku University, Japan

Correspondence: [*] Corresponding author: Zhiwei Zeng, Department of Aeronautics, Xiamen University, Xiamen 361005, Fujian, China. E-mail: [email protected]

Abstract: Pulsed eddy current (PEC) testing has attracted researchers' interest because the pulsed excitation comprises a broad band of frequencies and the response signal provides more information about defect than traditional eddy current testing. Various features have been extracted from PEC signal for defect characterization. In this paper, we extract frequency-domain features and propose defect characterization scheme for identifying defect's location, radius, and height.

Keywords: Pulsed eddy current testing, defect characterization, feature

DOI: 10.3233/JAE-141885

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 45, no. 1-4, pp. 621-625, 2014