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Issue title: Proceedings from the 16th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2013)
Guest editors: Xavier Maldague and Toshiyuki Takagi
Article type: Research Article
Authors: Li, Mina; * | Lowther, Davida | Guimar\~{a}es, Fredericob
Affiliations: [a] Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada | [b] Department of Electrical Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil | Université Laval, Canada | Tohoku University, Japan
Correspondence: [*] Corresponding author: Min Li, Room 630, McConnell Engineering Building, 3840 university street, H3A 2A7, Montreal, QC, Canada. Tel.: +1 514 398 1533; Fax: +1 154 398 4470; E-mail: [email protected]
Abstract: Fast and accurate crack detection techniques are required for the eddy current non destructive testing, especially in the case where a large amount of environmental noise exists. This paper presents a robust inverse solution for accurate shape reconstruction of natural cracks. A robust formulation is employed to deal with the uncertainties caused by the noise in the eddy current testing signals. The proposed method is capable of producing more robust results than the conventional formulation in terms of the statistical analysis of the reconstruction tests.
Keywords: Non-destructive testing, robustness, topological sensitivity analysis
DOI: 10.3233/JAE-141860
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 45, no. 1-4, pp. 425-430, 2014
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