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Article type: Research Article
Authors: Li, Chaoa | He, Si-Yuana; * | Yang, Jionga | Zhang, Zheb | Xiao, Bo-Xunc | Zhu, Guo-Qianga
Affiliations: [a] School of Electronic Information, Wuhan University, Wuhan, Hubei, China | [b] School of Engineering, Huazhong University of Agriculture, Wuhan, Hubei, China | [c] Geophysics Engineering Center, ChangJiang University, Jingzhou, Hubei, China
Correspondence: [*] Corresponding author: Si-Yuan He, School of Electronic Information, Wuhan University, Wuhan 430079, Hubei, China. Tel.: +86 135 4588 7007; E-mail: [email protected]
Abstract: The electromagnetic scattering from two-dimensional two-layer dielectric random rough surfaces is analyzed in this work based on Monte Carlo (MC) simulations. The random rough surface is characterized with Gaussian statistics for surface correlation length and for surface root mean square (RMS) height. The Poggio-Miller-Chang-Harrington-Wu-Tsai (PMCHWT) surface integral equation is adopted and implemented. A rigorous three-dimensional (3-D) multilevel UV method combined with adaptive cross approximation (ACA) is proposed to solve for the unknown electric and magnetic surface currents. By calculating monostaitc statistical radar cross section (RCS) of the layered structure, the influence of the rough surface RMS height, the correlation length, the medium permittivity and the layer thickness on the scattering characteristic is investigated.
Keywords: Two-layer, rough surface, MLUV/ACA, BICGSTAB, PMCHW
DOI: 10.3233/JAE-121640
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 42, no. 1, pp. 1-11, 2013
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