Study of flaws inspection in ceramics materials using UT and X-Ray methods

Issue title: Selected Papers from the 15th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2011)

Article type: Research Article

Authors: Nishimura, Yoshihiro^{a; *} | Suzuki, Takayuki^a | Kondo, Naoki^b | Kita, Hideki^b | Hirao, Kiyoshi^b

Affiliations: [a] Advanced Manufacturing Research Institute, Tsukuba Ibaraki, Japan | [b] Advanced Manufacturing Research Institute, Nagoya, Japan

Correspondence: [*] Corresponding author: Yoshihiro Nishimura, Advanced Manufacturing Research Institute, AIST, AIST Tsukuba EAST 1-2-1 Tsukuba Ibaraki, 305-8564, Japan. Tel.: +81 29 861 9315, +81 29 861 7253; Fax: +81 29 861 7853; E-mail: [email protected]

Abstract: The possibility of inspecting flaws in ceramic materials using Ultrasonic Testing (UT) and X-Ray methods was studied to investigate the reliability of ceramic material joints. First, Scanning Electron Microscope (SEM) images of two grades of ceramics were compared to those acquired by a scanning acoustic microscope (SAM) with respect to the number, and size of flaws. Second, ceramic sample with a known size of internal voids was evaluated by X-Ray-CT. Third, two jointed ceramic specimens were evaluated by X-Ray methods, SAM, and other UT methods. X-Ray methods and UT methods effectively established the safety of ceramic materials for structural uses.

Keywords: Silicon nitride, flaws, ultrasound, X-Ray/CT

DOI: 10.3233/JAE-2012-1490

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 39, no. 1-4, pp. 413-418, 2012