Abstract: The volume integral method is combined with a circuit solver for the
modelling of eddy-current inspection applications by taking into account the
effect of the measuring circuit. It is demonstrated that the latter may result
in noticeable deformations of the acquisition signals for specific inspection
situations, thus it cannot be eliminated by simple calibration; this effect
becomes increasingly important when the measuring frequency approaches the
probe resonance. Comparisons of the simulation results with experimental data
demonstrate the necessity of accounting for the circuit effect for inspection
in driver pickup mode and verify the validity of the approach.
