Modeling of thin conductive and magnetic layers in eddy current testing by overlapping finite elements

Issue title: Selected Papers from the 15th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2011)

Article type: Research Article

Authors: Zaidi, H.^{a; b; *} | Santandrea, L.^a | Krebs, G.^a | Le Bihan, Y.^a | Demaldent, E.^b

Affiliations: [a] Laboratoire de Génie Electrique de Paris, Paris, France | [b] CEA-LIST, Gif-sur-Yvette, France

Correspondence: [*] Corresponding author: H. Zaidi, Laboratoire de Génie Electrique de Paris, UMR 8507 CNRS, SUPELEC, Univ. Paris-Sud, UPMC, 11 rue Joliot-Curie, 91192 Gif-sur Yvette cedex, France. E-mail: [email protected]

Abstract: In this paper a new field of application of the overlapping finite element method is proposed for eddy current testing. This method, which has already been used to deal with the lift-off, is extended to the treatment of thin conducting and/or magnetic layers.

Keywords: Finite element method, dual formulations, eddy current testing, overlapping finite element

DOI: 10.3233/JAE-2012-1480

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 39, no. 1-4, pp. 341-346, 2012