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Article type: Research Article
Authors: Smail, Mostafa Kamela; * | Pichon, Lionela | Olivas, Marcb | Auzanneau, Fabriceb | Lambert, Marcc
Affiliations: [a] LGEP, Laboratoire de Génie Electrique de Paris, UMR 8507 CNRS, SUPELEC, Université de Paris-Sud, Université Pierre et Marie Curie, Plateau du Moulon, 91192 Gif-sur-Yvette, Cedex, France | [b] CEA-LIST Saclay – DRT/LIST/DTSI/SARC/LFSE, 91191 Gif-sur-Yvette, Cedex, France | [c] L2S, Laboratoire de Signaux et Système, UMR 8506 CNRS, SUPELEC, Université Paris-Sud, Plateau du Moulon, 91192 Gif-sur-Yvette, Cedex, France
Correspondence: [*] Corresponding author. E-mail: [email protected]
Abstract: This paper presents an effective technique to reconstruct faulty wiring networks and/or to localize the defects affecting the branches of a wiring network from the reflectometry response. The direct problem (propagation in the cables) is modelled by RLCG circuit parameters and the Finite Difference Time Domain (FDTD) method whereas the inverse problem is solved using Genetic Algorithms (GAs). In a first step the forward problems is validated by comparison with experimental and simulated data. In a second step the proposed reconstruction method is applied on different configurations and the results are discussed.
Keywords: Wiring network, faults, FDTD method, time domain reflectometry, reconstruction, and genetic algorithm
DOI: 10.3233/JAE-2011-1320
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 35, no. 1, pp. 39-55, 2011
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