Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Selected Papers from the 14th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2009), Part II
Article type: Research Article
Authors: Wang, Haitaoa; * | Zhang, Binqianga | Tian, G.Y.a; b | Zhou, Deqianga | Wang, Pinga | Li, Yongb
Affiliations: [a] School of automation engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu, 210016 P. R. China | [b] University of Newcastle upon Tyne, Newcastle, NE 7RU, UK
Correspondence: [*] Corresponding author: Haitao Wang, Tel.: +86 25 84896264; Fax: +86 25 84892368; E-mail: [email protected]; whtlqf@hotmail
Abstract: Pulsed Eddy Current (PEC) NDT has played a vital role in detection and classification of the surface and sub-surface defects in conductive structures. Normally, it uses peak values of the acquired transient field signals, and the combination of the feature values of the time of the peak to identify flaws with the help of Principal Component Analysis (PCA). However, it is found that the random noise undermines the classification results, because PCA works robustly only in the time domain. In the light of this drawback, the fundamental and the first-harmonic components are investigated and taken as the new feature values in the frequency domain. Through the analysis of the feature values in both time and frequency domains, the influence of random noise is mitigated. Consequently, surface defects, subsurface defects and metal thickness changes are classified with much higher identification accuracy.
Keywords: Pulsed Eddy Current, the fundamental component, the first harmonic component, defect
DOI: 10.3233/JAE-2010-1259
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 33, no. 3-4, pp. 1343-1349, 2010
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]