Affiliations: [a] Department of Systems Engineering and Computer
Science, 2366 6th Street N.W., N.W. Howard University, Washington, DC,
USA | [b] Department of Physics and Astronomy, 2355 6th Street,
N.W. Howard University, Washington, DC, USA
Correspondence:
[*]
Corresponding author: Dr. C. M. Kennefick, E-mail:
[email protected]
Abstract: Resistance to heat was simulated and measured in a computer model as
an annihilation of the elastic stress arising from the electric field in the
radiation. The elastic stress created from the electromagnetic wave was
superimposed with the elastic stresses produced by the rotation of a grain,
which was represented in two dimensions as an ellipse in the simulation. Both
the tilt angle of the grain with respect to the applied force and the aspect
ratio of the grain were varied in the computer program. Results are reported
here for a ratio of wavelength to total grain length of 10. Annihilation of an
elastic stress from the electric field of up to 80 to 90 percent was seen for
aspect ratios of 8/7 to 2 in several ranges of grain tilt angle. For this same
range in aspect ratio, steep transitions in the amount of annihilation were
seen near the ends of the grain. An elongated grain, with an aspect ratio of 10
and rotating counterclockwise, exhibited extinction of 50 to nearly 90 percent
of the electric field near the lower end of the grain throughout the tilt angle
range of 5° to 85°.
Keywords: Electric field, heat, electromagnetic wave, radiation, elastic stress
