Optimization for resistive reading probe of electric data storage system with a bit of 50 nm

Issue title: Selected Papers from the 13th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2007)

Article type: Research Article

Authors: Choi, Jae-Hak^a | Chun, Yon-Do^a | Han, Pil-Wan^a | Kim, Sol^{b; *} | Kim, Youn-Hyun^c | Ahn, Joonseon^d | Kim, Yong-Su^e | Lee, Ju^e

Affiliations: [a] Electric Motor Research Group, Korea Electrotechnology Research Institute, Boolmosangil, Changwon, 641-120, Korea | [b] Department of Electrical Engineering, Yuhan College, Goian, Sosa, Bucheon, Gyenggi, 442-749, Korea | [c] Department of Electrical Engineering, Hanbat National University, Duckmyoung, Yuseong, Daejeon, 305-719, Korea | [d] Department of Electrical Engineering, Osan College, Osan-si, Gyeonggi-do, 447-749, Korea | [e] Department of Electrical Engineering, Hanyang University, Haengdang, Seongdong, Seoul, 133-791, Korea

Correspondence: [*] Corresponding author. Tel.: +82 2 2610 0733; Fax: +82 2 2179 9733; E-mail: [email protected]

Abstract: This paper deals with a practical methodology to optimize a reading probe of data storage devices using polarization in electric field. The tip and angle of probe pole between a probe and a medium are adopted and identified as significant design variables that have an effect on the polarization direction. The proposed sensitivity function and optimum resistive reading probe shape in the electric recording devices could be obtained by using Response Surface Method and Finite Element Method.

Keywords: Electrical recording, reciprocity principles, response surface method, resistive reading probe

DOI: 10.3233/JAE-2008-981

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 28, no. 1-2, pp. 237-245, 2008