FEM-3D electromagnetic field analysis coupled with genetic algorithm for measurement uncertainties estimation and optimal design of an instrument transformer

Issue title: Selected Papers from the 13th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2007)

Article type: Research Article

Authors: Cundeva-Blajer, Marija^a | Arsov, Ljupco^a

Affiliations: [a] Ss. Cyril & Methodius University, Faculty of Electrical Engineering and Information Technologies, Karpos II, b.b. POBox 574, 1000 Skopje, R. Macedonia. Tel.: +389 2 3099 162; Fax: +389 2 3064262; E-mail: [email protected], [email protected]

Abstract: In the paper an advanced CAD (computer aided design) methodology for measurement uncertainties estimation of a combined current-voltage instrument transformer (CCVIT) will be presented. The metrological parameters of the CCVIT are influenced by many variables, mostly introduced by the non-linearity of the very complex CCVIT electromagnetic system. The electromagnetic field distribution in the CCVIT 3D domain will be determined by using an original program package FEM-3D (finite element method) developed at the Faculty of Electrical Engineering and Information Technologies (FEIT)-Skopje. The FEM results will be used for further metrological optimal design of the CCVIT by using the genetic algorithm. The FEM-3D estimated CCVIT metrological uncertainties will be experimentally verified through actual test results recorded in a laboratory.

Keywords: Instrument transformer, finite element method, genetic algorithm

DOI: 10.3233/JAE-2008-952

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 28, no. 1-2, pp. 25-31, 2008