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Article type: Research Article
Authors: Arunachalam, Kavithaa; * | Udpa, Satish S.a | Udpa, Lalitaa
Affiliations: [a] Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA
Correspondence: [*] Corresponding author: Kavitha Arunachalam, 2120 Engineering Building, Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA. Tel.: +1 517 432 1794; Fax: +1 517 353 1980; E-mail: [email protected]
Abstract: Non-intrusive inspection (NII) systems with high throughput are required for screening baggage, vehicles and cargo at ports of entry. Of the existing NII techniques, systems employing X-rays have undergone rapid evolution. Though well established, the probability of detecting contraband goods in the radiographic image obtained using conventional high energy X-ray systems depends on operator skill and orientation of the contraband material inside the container. Alternative techniques employing back and forward scattered X-rays operating at dual energy can only broadly classify objects containing contraband material and cannot be used to uniquely locate the contraband good. Limitations of X-ray radiography and scattererd imaging systems could be resolved using 2D tomography systems. But, the complexities associated with practical implementation of an X-ray CT system for screening baggage, vehicles and cargo is far from realization. This paper presents an X-ray imaging technique capable of providing 2D tomograms using limited-view projections as an ideal compromise for detecting packaged, vehicle-borne and human-borne explosives, weapons and contraband goods. Numerical simulations of the proposed system employing L-shaped detectors and iterative reconstruction algorithms indicate the feasibility of an alternate security screening system to detect and uniquely locate explosives and contraband goods concealed in cargo, baggage and vehicles.
Keywords: Security screening, X-rays, limited view, tomography
DOI: 10.3233/JAE-2006-778
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 24, no. 1-2, pp. 79-89, 2006
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