An emigration genetic algorithm for vector optimizations of electromagnetic devices

Issue title: Special Volume: Proceedings of the eleventh International Symposium on Applied Electromagnetics and Mechanics ISEM-Versailles ISEM 03

Article type: Research Article

Authors: Wang, Yuhuai^a | Yang, Shiyou^{a; *} | Ni, Guangzheng^a | Ni, Peihong^a | Ho, S.L.^b

Affiliations: [a] Zhejiang University, Hangzhou, 310027, China | [b] Department of EE, Hong Kong Polytechnic University, Hong Kong

Correspondence: [*] Corresponding author: Shiyou Yang; E-mail:[email protected]

Abstract: Based on the success in the design of an Emigration Operator and the introduction of other approaches such as the fitness sharing, the clustering method, and the elitism strategy, an Emigration Genetic Algorithm is now proposed for the vector optimizations of electromagnetic devices. Numerical results are reported to demonstrate the effectiveness of the proposed algorithm in solving engineering multiobjective optimal design problems.

DOI: 10.3233/JAE-2004-544

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 19, no. 1-4, pp. 103-109, 2004