Diagnostics of ultrashort electron bunch by coherent transition/diffraction radiation

Issue title: Proceedings of the tenth International Symposium on Applied Electromagnetics and Mechanics ISEM-Tokyo

Article type: Research Article

Authors: Watanabe, T.^{a; *} | Sugahara, J.^a | Yoshii, K.^a | Ueda, T.^a | Uesaka, M.^a | Yoshimatsu, T.^b | Kondo, Y.^b | Sugiyama, Y.^c | Sasaki, S.^c | Ishi, K.^c | Shibata, Y.^c

Affiliations: [a] Nuclear Engineering Res. Laboratory, University of Tokyo, 2-22 Shirakata-Shirane, Tokai, Naka, Ibaraki, Japan | [b] School of Engineering, Tohoku University, Aoba08, Aramaki, Aoba-ku, Sendai, Miyagi, Japan | [c] Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-2-1 Katahira, Aoba-ku, Sendai 980-77, Japan

Correspondence: [*] Corresponding author: Takahiro Watanabe, Tel.: +81 29 287 8432; Fax: +81 29 287 8488; E-mail: [email protected]

Abstract: Measurements of longitudinal bunch length of picosecond electron bunches have been performed by the femtosecond streak camera, the interferometer and the polychromator and their results were compared with one another. As regards the radiation, transition radiation and diffraction radiation were investigated through the diagnostics. As a result, the fine agreements between them within 200 fs were obtained and the reliability of the interferometer and the polychromator for the diagnostics of less than picosecond electron bunch were verified. Furthermore, nondestructive diagnostics for subpicosecond bunches was performed utilizing coherent diffraction radiation (CDR) interferometry.

DOI: 10.3233/JAE-2002-386

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 14, no. 1-4, pp. 191-196, 2002