Affiliations: Faculty of Computer Science, Bialystok University of Technology, Wiejska 45A, 15-351 Bialystok, Poland. [email protected], [email protected]
Correspondence:
[†]
Address for correspondence: Faculty of Computer Science, Bialystok University of Technology, Wiejska 45A, 15-351 Bialystok, Poland
Note: [*] This work was supported by the grant S/WI/3/13 from Bialystok University of Technology, Faculty of Computer Science
Abstract: Controlled random tests, methods of their generation, as well as their application to the testing of both hardware and software systems are discussed. Available evidences suggest that high computational complexity is one of the main drawback of these methods. Therefore we propose a technique to overcome this problem. In the paper, we introduce the concept of multiple controlled random tests (MCRT) and examine various numerical characteristics in terms of the development of those tests. We prove the effectiveness of the Euclidean distance, as well as we propose an easy computational method of its calculation, in the process of constructing MCRT. The presented approach is evaluated through the experimental study in the context of testing of Random Access Memory (RAM).
Keywords: antirandom tests, controlled random tests, multiple tests, RAM testing
