Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Erceg, Markoa; * | Lazar, Martinb
Affiliations: [a] Department of Mathematics, Faculty of Science, University of Zagreb, Bijenička cesta 30, Zagreb, Croatia. E-mail: [email protected] | [b] University of Dubrovnik, Ćira Carića 4, Dubrovnik, Croatia. E-mail: [email protected]
Correspondence: [*] Corresponding author. E-mail: [email protected].
Abstract: Practical applications of semiclassical measures are tightly connected with a so called oscillatory property, prevailing leakage of information related to high frequencies. In this paper we propose a complementary, concentratory property which prevents loss of information related to low frequencies. We demonstrate that semiclassical measures attain the best performance level if both the properties are satisfied simultaneously, and address a question if this is possible to achieve for an arbitrary bounded L2 sequence, providing a negative answer. Comparison of H-measures with semiclassical ones is presented, showing precedence of the latter for problems exhibiting just a single frequency scale. Finally, we present some (strong) compactness results based on the above properties.
Keywords: Semiclassical measures, H-measures, oscillatory sequence, concentratory sequence, characteristic scale, Kolmogorov–Riesz compactness theorem
DOI: 10.3233/ASY-181474
Journal: Asymptotic Analysis, vol. 109, no. 3-4, pp. 171-192, 2018
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]