Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Banks, H.T.a; * | Catenacci, Jareda | Criner, Amandab
Affiliations: [a] Center for Research in Scientific Computation, North Carolina State University, Raleigh, NC, USA | [b] Materials and Manufacturing Directorate, Air Force Research Labs, Wright-Patterson Air Force Base, OH, USA
Correspondence: [*] Corresponding author: H.T. Banks, Center for Research in Scientific Computation, North Carolina State University, Raleigh, NC 27695-8212, USA. E-mail:[email protected]
Abstract: Reflectance spectroscopy obtained from thermally treated silicon nitride carbon based ceramic matrix composites is used to quantity the oxidation products SiO_2 and SiN. The data collection is described in detail in order to point out the potential biasing present in the data processing. A probability distribution is imposed on selected model parameters, and then non-parametrically estimated. A non-parametric estimation is chosen since the exact composition of the material is unknown due to the inherent heterogeneity of ceramic composites. The probability distribution is estimated using the Prohorov metric framework in which the infinite dimensional optimization is reduced to a finite dimensional optimization using an approximating space composed of linear splines. A weighted least squares estimation is carried out, and uncertainty quantification is performed on the model parameters, including a piecewise asymptotic confidence band for the estimated probability density. Our estimation results indicate a distinguishable increase in the SiO_2 present in the samples which were heat treated for 100 hours compared to those treated for 10 hours.
Keywords: Ceramic matrix composites, prohorov metric, reflectance spectroscopy, uncertainty quantification
DOI: 10.3233/JAE-162168
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 1-2, pp. 3-24, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]