Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Prémel, Denisa; | Granet, Gérardb
Affiliations: [a] CEA, LIST, Laboratoire Simulation et Modélisation en Électromagnétisme, Gif-sur-Yvette \unskip \break Cedex, France | [b] CNRS UMR 6602, Institut Pascal, Université Blaise Pascal, France
Correspondence: [*] Corresponding author: Denis Premel, CEA, LIST, Laboratoire Simulation et Modélisation en Électromagnétisme, 91191 Gif-sur-Yvette Cedex, France. E-mail: [email protected]
Abstract: This paper concerns the development of a semi-analytical model dedicated to the fast computation of the response of a 3D Eddy Current (EC) probe scanning a planar conductor of complex shape. The workpiece is characterized by a finite number of complex interfaces k, 1 ≤ k ≤ N, each one being defined by any 2D arbitrary surface ak(x, y). A previous semi-analytical model based on the Curvilinear Coordinate Method (CCM) has been presented for the computation of quasi-static fields induced by any 3D EC probe scanning a half-space of complex shape. This paper gives a natural extension of this preliminary work. CCM consists in introducing a change of coordinates in order to be able to write analytically and easily boundary conditions separating two media. No mesh is needed, nevertheless, the covariant form of Maxwell’s equations is required due to a novel generalized metric space. Boundary conditions at multiple interfaces are efficiently implemented thanks to the S-matrix algorithm. Finally, some numerical experiments show the validity of the numerical model by some comparison between simulated data obtained by a FE commercial code and those provided by the proposed numerical model.
Keywords: Covariant form of Maxwell’s equations, eddy current simulation, Eddy current nondestructive testing
DOI: 10.3233/JAE-171218
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 59, no. 4, pp. 1239-1245, 2019
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]