Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Kikuchi, Hiroakia; | Nakamura, Hikarua | Sumida, Chihiroa
Affiliations: [a] Faculty of Science and Engineering, Iwate University, Morioka, Iwate, Japan
Correspondence: [*] Corresponding author: Hiroaki Kikuchi, Faculty of Science and Engineering, Iwate University, Morioka Iwate, 020-8551, Japan. Tel.: +81 19 621 6890; Fax: +81 19 621 6890; E-mail: [email protected]
Abstract: We investigated the effects of DC bias current applied directly to the elements on the inclined easy axis thin-film magnetoimpedance element indicating a discontinuous impedance jump. We clarified that the DC bias current contributes to changes in the configuration of domain structure, which induces modification of impedance profiles on the 20 μm-wide element. On the other hand, 40 and 80 μm-wide elements did not show the apparent changes on the magnetoimpedance profiles. The influence of DC bias current on jumping point is not so much, which is attributed to the small bias magnetic field generated by the current; the limited bias level is not high due to Joules heating by the current.
Keywords: Magnetoimpedance, discontinuous jump, DC bias, inclined easy axis, thin-film
DOI: 10.3233/JAE-171095
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 59, no. 1, pp. 123-128, 2019
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]