Finite element simulation of the probe displacement in eddy current testing

Issue title: Proceedings from the 16th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2013)

Guest editors: Xavier Maldague and Toshiyuki Takagi

Article type: Research Article

Authors: Zaidi, Houda^a | Santandrea, Laurent^a | Krebs, Guillaume^a | Le Bihan, Yann^{a; *} | Demaldent, Edouard^b

Affiliations: [a] Laboratoire de Génie Electrique de Paris, University Paris-Sud, Gif-sur-Yvette, France | [b] CEA-LIST, Gif-sur-Yvette, France | Université Laval, Canada | Tohoku University, Japan

Correspondence: [*] Corresponding author: Yann Le Bihan, Laboratoire de Génie Electrique de Paris (LGEP), UMR 8507 CNRS, SUPELEC, Univ. Paris-Sud, UPMC, 11 rue Joliot-Curie, 91192 Gif-sur-Yvette cedex, France. E-mail: [email protected]

Abstract: In this paper an approach is proposed for the taking into account of the displacement of the probe in the finite element simulation of eddy current testing. The proposed approach allows to reduce the difficulties associated to the finite element meshing. The computations are performed using two finite element formulations. Two test ECT problems are proposed. Numerical results are compared with experimental data.

Keywords: Eddy current testing, finite element method, overlapping method, probe displacement

DOI: 10.3233/JAE-141921

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 45, no. 1-4, pp. 887-893, 2014