Estimation of a surface current distribution from 2D magnetic field measurements

Issue title: Selected Papers from the 15th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2011)

Article type: Research Article

Authors: Nguyen, T.A.^a | Joubert, P.-Y.^{b; *} | Lefebvre, S.^a | Chaplier, G.^a

Affiliations: [a] SATIE, ENS Cachan, CNAM, CNRS, UniverSud, Cachan, France | [b] IEF, University Paris Sud, CNRS, 91405 Orsay, France

Correspondence: [*] Corresponding author: P.-Y. Joubert, IEF, University Paris Sud, CNRS, 91405 Orsay, France. E-mail: [email protected]

Abstract: The paper reports on the estimation of the distribution of currents flowing in a metalized part, starting from two-dimensional maps of the magnetic field induced above the part, with the monitoring of power semiconductor dies in view. The estimation is obtained from the measured data by inverting a mesh-free modeling of the induced magnetic field. First inversion results of experimental data are presented and discussed.

Keywords: Current distribution, Hall effect sensor, power semiconductor modules monitoring, mesh free modeling method, inverse problem

DOI: 10.3233/JAE-2012-1455

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 39, no. 1-4, pp. 151-156, 2012