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Article type: Research Article
Authors: Zhang, Hongxina; b; c; * | Zhang, Jinlinga | Wang, Danzhia | Lu, Yinghuaa
Affiliations: [a] School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China | [b] Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University off Posts and Telecommunications, Beijing, China | [c] State Key Laboratory of Information Security, Graduate School of Chinese Academy of Sciences, Beijing, China
Correspondence: [*] Corresponding author: Hongxin Zhang, School of Electronic Engineering, P.O. BOX 116, Beijing University of Posts and Telecommunications, Beijing 100876, China. Tel.: +86 010 6228 2818; Fax: +86 010 6228 1958; E-mail: [email protected]
Abstract: To quantitatively evaluate the strength of information leakage arising from computer under shielding conditions, a mathematic model is established for information leakage based on near-field measurement results by using the equivalence principle. In order to study the leakage threshold and the shielding performance for information leakage, the notions of Information Identifying Degree, Information Resolution Threshold and Computer Security Defence Distance are formalized respectively. Then, Information Identifying Degree, Information Resolution Threshold and Computer Security Defence Distance are analyzed. So, the strength of information leakage is quantitatively assessed under different shielding levels and distance. The simulation results show that FCC and MIL461C standards are not suitable for the evaluation of information leakage and even strictly standard should be considered. At last, new shielding levels of information leakage are marked off and the shielding effects are assessed by using Information Resolution Threshold. This research aptly provides a quantitative evaluation method for assessing the information leakage strength and presents a means to evaluate information leakage shielding effectiveness of computers.
Keywords: Electromagnetic emission, information leakage, information security
DOI: 10.3233/JAE-2012-1432
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 40, no. 2, pp. 101-111, 2012
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