Affiliations: [a] Air Force Research Laboratory, Sensors Directorate, 80
Scott Dr. Hanscom AFB, MA 01731, USA | [b] Air Force Institute of Technology, 2950 Hobson Way,
Wright-Patterson AFB, OH 45433, USA | [c] BerrieHill Research Corporation, 240 W. Elmwood Dr.,
Ste. 1001, Datyton, OH 45459, USA | [d] Air Force Research Laboratory, Materials &
Manufacturing Directorate, 2230 10th St., Wright-Patterson AFB, OH 45433,
USA
Correspondence:
[*]
Corresponding author: James Stewart, AFRL/SNHA, 80 Scott Dr.,
Hanscom AFB, MA, 01731, USA. Tel.: +1 781 377 0932; Fax: +1 781 377 1074;
E-mail: [email protected]
Abstract: In this paper a method employing a hand-held network analyzer is
presented that allows in situ measurement of materials in environments
unreachable by traditional network analyzers. Calculation of permittivity and
permeability is accomplished using two reflection measurements from a waveguide
probe. A comparison between the theoretical and experimentally measured
reflection coefficients allows extraction of the material parameters using a
root search algorithm. Parameter extraction results are presented and compared
to those obtained from an HP8510 network analyzer employing the same waveguide
probe and test materials.
