Sensitivity estimation for magnetic devices using a double-layer model

Issue title: ISTET '01

Article type: Research Article

Authors: Mueller, C.^{a; *} | Scheinert, G.^a | Uhlmann, F.H.^a

Affiliations: [a] Department of Fundamentals and Theory of Electrical Engineering, Technical University of Ilmenau, Ilmenau, Germany

Correspondence: [*] Corresponding author. Objexxts Software GmbH (Ltd.), Langewiesener Str. 16, D-98693 Ilmenau, Germany. Tel.: +49 3677 2081730; E-mail: [email protected]

Abstract: The paper describes an approach to general-purpose design sensitivity analysis for electromagnetic devices. Microsystem technology often requires the assessment of manufacturing techniques or effects of tolerances. Emphasis is therefore put on the adaptability to different requirements, depending on desired accuracy, computational effort and significance. By introducing a distributed sensitivity function, the effect of small contour distortions can be described. The design sensitivity is based on a magnetic double-layer model. It is shown that sensitivity can be expressed in terms of virtual anti-parallel double-layer currents, flowing in a movable contour. The sensitivity is explicitly derived for two-dimensional coordinate systems using the finite-difference method within a commercially available field computation program. The proposed method is demonstrated by two examples.

DOI: 10.3233/JAE-2003-260

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 17, no. 1-3, pp. 221-230, 2003