Journal of X-Ray Science and Technology - Volume 5, issue 4

Authors: Fraenkel, Benjamin S.

Article Type: Research Article

Abstract: The process of multiple x-ray reflections in single crystals is presented as a tool for x-ray spectroscopy. Among the possible applications it is shown that monochromatic spatial resolution of the x-ray source may be obtained through this process. With this method the distribution of variously ionized ions in laser-produced plasmas may be determined. Absolute wavelength values of x-ray transitions can be obtained. The x-ray emission qualities of x-ray tubes can be determined.

DOI: 10.3233/XST-1995-5401

Citation: Journal of X-Ray Science and Technology, vol. 5, no. 4, pp. 341-367, 1995

Authors: Pahl, R. | Bonse, U.

Article Type: Research Article

Abstract: We describe a novel USAXS camera that combines the use of synchrotron radiation with collimation by perfect-crystal optics. The outstanding result is that high measuring intensities and extreme angular resolution are achieved even with a point-focusing geometry. Along the principles of the original design (U. Bonse and M. Hart, Z. Phys. 189, 151 (1966)) which had to be operated at an x-ray tube, we employ two sets of pairs of multiply reflecting channel-cut crystals diffracting in the horizontal and vertical planes. The collimation characteristics thus obtained are equivalent to the point-focusing geometry of conventional SAXS cameras based on slit collimation. …We present results from samples of polystyrene spheres which were used for test measurements performed with synchrotron radiation of DORIS at HASYLAB/DESY in Hamburg. Taking into account the number of reflections within the channel-cut crystals, the theoretical resolution was calculated and found to agree well with that derived from measured scattering patterns. Structures as large as about 1.3 μm could easily be identified from the scattering curves. As expected with point-focusing geometry, desmearing of raw data was unnecessary. Show more

DOI: 10.3233/XST-1995-5402

Citation: Journal of X-Ray Science and Technology, vol. 5, no. 4, pp. 368-378, 1995

Authors: Ponomarev, Yu. V. | Palkin, A. B. | Savel'ev, A. B. | Salaschenko, N. N.

Article Type: Research Article

Abstract: For two three-layer systems, Sc/Fe/Sc and Fe/Sc/Fe, the fine structure in specular reflected x rays above the Fe K-edge has been investigated experimentally. Computer simulation of ReflEXAFS formation on multilayered structures has been done. Estimates of each layer's thickness and density as well as of local atomic order in Fe layers have been obtained. The possibility of ultrathin-layer investigations (down to a few angstroms) has been analyzed.

DOI: 10.3233/XST-1995-5403

Citation: Journal of X-Ray Science and Technology, vol. 5, no. 4, pp. 379-388, 1995

Authors: Chernov, V. A. | Chkhalo, N. I. | Fedorchenko, M. V. | Kruglyakov, E. P. | Mytnichenko, S. V. | Nikitenko, S. G.

Article Type: Research Article

Abstract: A detailed study of structural changes occurring in films and on boundaries in multilayers upon annealing with EXAFS, WAXS, and SAXS methods was performed. The optimum temperature of annealing for the Ni/C and Co/C multilayers obtained by the pulsed laser evaporation method was found.

DOI: 10.3233/XST-1995-5404

Citation: Journal of X-Ray Science and Technology, vol. 5, no. 4, pp. 389-395, 1995

Authors: Bukreeva, I. N. | Kozhevnikov, I. V. | Vinogradov, A. V.

Article Type: Research Article

Abstract: Basic properties of whispering gallery mirrors in the soft x-ray region are considered. The following applications of whispering gallery optics are discussed: increasing the utilization efficiency of point source radiation, deflecting a synchrotron radiation beam to the vertical plane and transporting it to another horizontal level, resonators for soft x-ray lasers, and using the whispering gallery effect to investigate the roughness of concave surfaces.

DOI: 10.3233/XST-1995-5405

Citation: Journal of X-Ray Science and Technology, vol. 5, no. 4, pp. 396-419, 1995