ReflEXAFS Spectroscopy of Thin Fe/Sc Multilayers

Article type: Research Article

Authors: Ponomarev, Yu. V. | Palkin, A. B. | Savel'ev, A. B. | Salaschenko, N. N.

Affiliations: International Laser Center, Moscow State University, Vorobyevy Gory, 119899 Moscow | Russia Institute of Applied Physics, Ulyanova str. 46, 603600 Nizhnii Novgorod, Russia

Note: [] E-mail:[email protected]

Abstract: For two three-layer systems, Sc/Fe/Sc and Fe/Sc/Fe, the fine structure in specular reflected x rays above the Fe K-edge has been investigated experimentally. Computer simulation of ReflEXAFS formation on multilayered structures has been done. Estimates of each layer's thickness and density as well as of local atomic order in Fe layers have been obtained. The possibility of ultrathin-layer investigations (down to a few angstroms) has been analyzed.

DOI: 10.3233/XST-1995-5403

Journal: Journal of X-Ray Science and Technology, vol. 5, no. 4, pp. 379-388, 1995