Journal of X-Ray Science and Technology - Volume 5, issue 4
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Impact Factor 2016: 1.111
Journal of X-Ray Science and Technology is an international journal designed for the diverse community (biomedical, industrial and academic) of users and developers of novel x-ray imaging techniques. The purpose of the journal is to provide clear and full coverage of new developments and applications in the field.
Areas such as x-ray microlithography, x-ray astronomy and medical x-ray imaging as well as new technologies arising from fields traditionally considered unrelated to x rays (semiconductor processing, accelerator technology, ionizing and non-ionizing medical diagnostic and therapeutic modalities, etc.) present opportunities for research that can meet new challenges as they arise.
Abstract: The process of multiple x-ray reflections in single crystals is presented as a tool for x-ray spectroscopy. Among the possible applications it is shown that monochromatic spatial resolution of the x-ray source may be obtained through this process. With this method the distribution of variously ionized ions in laser-produced plasmas may be determined. Absolute wavelength values of x-ray transitions can be obtained. The x-ray emission qualities of x-ray tubes can be determined.
Abstract: We describe a novel USAXS camera that combines the use of synchrotron radiation with collimation by perfect-crystal optics. The outstanding result is that high measuring intensities and extreme angular resolution are achieved even with a point-focusing geometry. Along the principles of the original design (U. Bonse and M. Hart, Z. Phys. 189, 151 (1966)) which had to be operated at an x-ray tube, we employ two sets of pairs of multiply reflecting channel-cut crystals diffracting in the horizontal and vertical planes. The collimation characteristics thus obtained are equivalent to the point-focusing geometry of conventional SAXS cameras based on slit collimation.…We present results from samples of polystyrene spheres which were used for test measurements performed with synchrotron radiation of DORIS at HASYLAB/DESY in Hamburg. Taking into account the number of reflections within the channel-cut crystals, the theoretical resolution was calculated and found to agree well with that derived from measured scattering patterns. Structures as large as about 1.3 μm could easily be identified from the scattering curves. As expected with point-focusing geometry, desmearing of raw data was unnecessary.
Abstract: For two three-layer systems, Sc/Fe/Sc and Fe/Sc/Fe, the fine structure in specular reflected x rays above the Fe K-edge has been investigated experimentally. Computer simulation of ReflEXAFS formation on multilayered structures has been done. Estimates of each layer's thickness and density as well as of local atomic order in Fe layers have been obtained. The possibility of ultrathin-layer investigations (down to a few angstroms) has been analyzed.
Abstract: A detailed study of structural changes occurring in films and on boundaries in multilayers upon annealing with EXAFS, WAXS, and SAXS methods was performed. The optimum temperature of annealing for the Ni/C and Co/C multilayers obtained by the pulsed laser evaporation method was found.
Abstract: Basic properties of whispering gallery mirrors in the soft x-ray region are considered. The following applications of whispering gallery optics are discussed: increasing the utilization efficiency of point source radiation, deflecting a synchrotron radiation beam to the vertical plane and transporting it to another horizontal level, resonators for soft x-ray lasers, and using the whispering gallery effect to investigate the roughness of concave surfaces.