Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: International Conference on Fracture and Strength 2010 – From Physical to Holistic
Article type: Research Article
Authors: Yu, Shouwen; | Yu, Li | Zhang, Liping
Affiliations: Department of Engineering Mechanics, Tsinghua University, Beijing, P. R. China
Note: [] Address for correspondence: Shouwen Yu, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, P. R. China. E-mail: [email protected].
Abstract: Ferroelectric materials is one of important smart materials using as actuators and sensors. Electric fatigue and damage of radiation may induce pinched polarization hysteresis loops and asymmetric strain hysteresis loops of ferroelectric materials, respectively. The damage level can be reflected by the evolution of hysteresis loops. This paper formulates a novel constitutive model to characterize the hysteresis deformation behavior of ferroelectric ceramics by electric fatigue. The results show that the alignment of the defect dipoles acts as an internal bias field and increases the coercive field, while the domain-wall pinning can prohibit domain switching and causes degradation of remanent polarization. Then the damage criterion of the ferroelectric materials due to electric fatigue is proposed. The temperature in the ferroelectric and ferromagnetic materials may rise due to energy dissipation under loading. Thermal effects on the mechanical behavior in ferroelectric/ferromagnetic materials are investigated. Using the magnetic saturation model, the temperature fields around the tip of a narrow elliptic hole are calculated under different conditions. It is found that the magnitude of temperature increment strongly depends upon the geometrical shape of the hole, the frequency and wave shape of the magnetic loading.
Keywords: Cyclic-electric loading, thermal effect, domain switching, ferroelectric materials
DOI: 10.3233/SFC-2011-0121
Journal: Strength, Fracture and Complexity, vol. 7, no. 1, pp. 33-41, 2011
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]