Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Yokobori, Jr., A. Toshimitsu; | Kobayashi, Tsukasa | Hashimoto, Keizo | Salama, Kamel
Affiliations: Fracture Research Institute, Tohoku University, Aoba Aramaki Aoba‐ku Sendai‐shi #980‐8579, Japan | Faculty of Engineering and Science Teikyo University, Toyosatodai 1‐1 Utsunomiya‐shi #320‐8511, Japan | Texas Center for Superconductivity at the University of Houston, Houston, TX 77204‐5002, USA
Note: [] Corresponding author. E‐mail: [email protected].
Abstract: High temperature YBa2Cu3Ox (123, YBCO) superconductors have been shown to possess high current carrying capability which is confined to currents flowing along the strongly super‐conducting a–b planes within a single oriented domain. Usually, in this material, thermal cycling occurs in the temperature region ranging from −196°C (liquid nitrogen) under actual operation to room temperature under out of operation for maintenance. Micro‐cracks are considered to initiate during these thermal cycles which result in the high electric resistance. Therefore, the existence of micro‐cracks is considered to be a dominant factor in decreasing Jc. In this study, an apparatus for thermal cycling has been designed and built to provide thermal cycles ranging from −196°C to room temperature. To clarify the time sequential deterioration on the mechanical properties of YBCO due to thermal cycles, a sharp notched RCT specimen with 20° of notch tip angle and 0.02 mm of notch tip radius was designed. By using this specimen, the time sequential deterioration of stiffness, dP/dδ and fracture toughness of YBCO for a sharp notched RCT specimen due to thermal cycles were investigated. The results show a correlation between these mechanical properties and previously obtained the super‐conducting properties of this material. Thermal cycling causes the deterioration of mechanical properties which results in the deterioration of critical current density.
Journal: Strength, Fracture and Complexity, vol. 2, no. 1, pp. 11-19, 2004
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]