Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: International Conference on Complexity and Frontiers in Strength and Fracture (ICS 2001), Sendai, Japan, 24–27 June 2001, Part II
Article type: Research Article
Authors: Hara, H. | Tsuzuki, Y. | Yokobori, Jr., A.T.;
Affiliations: Department of Aeronautics and Space Engineering, Graduate School of Engineering, Tohoku University, Sendai 980‐8579, Japan | Department of Electrical Information Engineering, Faculty of Engineering, Aomori University, Aomori 030‐0943, Japan
Note: [] Corresponding author. E‐mail: [email protected].
Abstract: An expression representing trajectories of fracture paths is obtained as a first arrival length. The first arrival length is a function representing a quantity generalized from the first passage time. The expression is the average value of the first arrival length found by solving a backward Fokker–Planck equation on a curved spatiotemporal surface. The backward FP equation is derived from generalized random walks (GRW). In the GRW, jump probabilities are specified by additional arbitrary functions. Furthermore, we propose a stochastic differential equation of random variables representing the fracture paths.
Keywords: Fracture paths, first arrival length, random walks, curved spatiotemporal surface
Journal: Strength, Fracture and Complexity, vol. 1, no. 2, pp. 59-67, 2003
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]