Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Ogura, Torua; * | Shiraishi, Chihirob
Affiliations: [a] Clinical Research Support Center, Mie University Hospital, Mie, Japan | [b] Department of Pharmacy, Mie University Hospital, Mie, Japan
Correspondence: [*] Corresponding author: Toru Ogura, Clinical Research Support Center, Mie University Hospital, 2-174, Edobashi, Tsu City, Mie, 514-8507, Japan. Tel.: +81 59 231 5345; Fax: +81 59 231 5345; E-mail: [email protected].
Abstract: In medical research, it is common to estimate parameters for each group and then evaluate the estimated parameters for each group without comparing the groups. However, researchers frequently want to determine whether the two distributions using the estimated parameters differ significantly between the two groups. For the Weibull distribution, the two-sample Kolmogorov-Smirnov test (two-sided) was used to examine whether the two distributions were significantly different between the two groups. Based on this, we developed a method to compare the two groups using a three-parameter Fréchet distribution. The number of days from drug administration to remission frequently followed a Fréchet distribution. It is appropriate to use a three-parameter Fréchet distribution with a location parameter because patients typically go into remission after several days of drug administration. We propose a minimum variance linear estimator with a hyperparameter (MVLE-H) method for estimating a three-parameter Fréchet distribution based on the MVLE-H method for estimating a three-parameter Weibull distribution. We verified the effectiveness of the MVLE-H method and the two-sample Kolmogorov-Smirnov test (two-sided) on the three-parameter Fréchet distribution using Monte Carlo simulations and numerical examples.
Keywords: Parameter estimation, remission, small sample sizes, three-parameter Fréchet distribution, two-sample Kolmogorov-Smirnov test
DOI: 10.3233/MAS-231466
Journal: Model Assisted Statistics and Applications, vol. 19, no. 2, pp. 197-210, 2024
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]