Affiliations: Center for Solid State Science, Arizona State University, Tempe, Arizona 85287 | Department of Physics, Brigham Young University, Provo, Utah 84602 | MOXTEK Inc., 452 West 1260 North, Orem, Utah 84057 | Department of Physics, University of Arizona, Tucson, Arizona 85721
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Abstract: Single layer and multilayer films of titanium and Inconel 600 (76 at.% Ni, 16 at.% Cr, 8 at.% Fe) have been prepared by sputtering in argon/nitrogen atmospheres, with nitrogen partial pressures ranging from 0% to 40%. The microstructure and chemistry of the sputtered films were characterized using transmission/high-resolution electron microscopy, x-ray diffraction, x-ray photoelectron spectroscopy, secondary ion mass spectroscopy, electron probe microanalysis, and ion beam analysis with MeV helium beams. The microstructure depended on deposition power and individual layer thickness, as well as the sputtering atmosphere composition. Metal nitrides were formed in single layers of both materials whereas, for multilayers, nitrogen was preferentially incorporated into the titanium layer.
