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Article type: Research Article
Authors: Nelson, R. D. | Witteles, E. M.
Affiliations: World-wide Innovative Technology Corporation, P.O. Box 7146, Huntsville, Alabama 35807
Abstract: This paper investigates the feasibility of using large semiconductor image plane arrays (incorporating detector and readout functions) for radiology. It is anticipated that this approach will offer higher sensitivity and spatial resolution than many alternatives. The disadvantage is a smaller object field than can be imaged with film or by using optics after conversion of x rays to visible radiation. Semiconductor image plane arrays (detector plus multiplexing functions) should have utility because of the potential for higher sensitivity and spatial resolution compared with either computed radiography (photostimulable phosphors) or film cassettes. The major limitation is limited image plane size because of the maximum size of the silicon wafers.
DOI: 10.3233/XST-1994-4410
Journal: Journal of X-Ray Science and Technology, vol. 4, no. 4, pp. 353-360, 1994
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