Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Shi, Liua; b; c; d; 1 | Wei, Cunfenga; b; c; d; * | Jia, Tonga; b; c; d; 2 | Zhao, Yunsonge; f; 3 | Liu, Baodonga; b; c; d; *
Affiliations: [a] Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China | [b] School of Nuclear Science and Technology, University of Chinese Academy of Sciences, Beijing, China | [c] Jinan Laboratory of Applied Nuclear Science, Jinan, China | [d] CAEA Center of Excellence on Nuclear Technology Applications for Nuclear Detection and Imaging, Beijing, China | [e] School of Mathematical Sciences, Capital Normal University, Beijing, China | [f] Beijing Advanced Innovation Center for Imaging Technology, Capital Normal University, Beijing, China
Correspondence: [*] Corresponding authors: Cunfeng Wei, Multidisciplinary Building 1103, No. 19B Yuquan Road, Beijing 100049, China. E-mail: [email protected]; https://orcid.org/0000-0001-7686-9587 and Baodong Liu, Multidisciplinary Building 1113, No.19B Yuquan Road, Beijing 100049, China. E-mail: [email protected]; https://orcid.org/0000-0003-4364-9478.
Note: [1] https://orcid.org/0000-0002-8552-2259.
Note: [2] https://orcid.org/0000-0002-1873-7356.
Note: [3] https://orcid.org/0000-0002-3059-5258.
Abstract: BACKGROUND: The rapid development of industrialization in printed circuit board (PCB) warrants more complexity and integrity, which entails an essential procedure of PCB inspection. X-ray computed laminography (CL) enables inspection of arbitrary regions for large-sized flat objects with high resolution. PCB inspection based on CL imaging is worthy of exploration. OBJECTIVE: This work aims to extract PCB circuit layer information based on CL imaging through image segmentation technique. METHODS: In this work, an effective and applicable segmentation model for PCB CL images is established for the first time. The model comprises two components, with one integrating edge diffusion and l0 smoothing to filter CL images with aliasing artifacts, and the other being the fuzzy energy-based active contour model driven by local pre-fitting energy to segment the filtered images. RESULT: The proposed model is able to suppress aliasing artifacts in the PCB CL images and has good performance on images of different circuit layers. CONCLUSIONS: Results of the simulation experiment reveal that the method is capable of accurate segmentation under ideal scanning condition. Testing of different PCBs and comparison of different segmentation methods authenticate the applicability and superiority of the model.
Keywords: PCB, CL, image segmentation, active contour model
DOI: 10.3233/XST-240006
Journal: Journal of X-Ray Science and Technology, vol. 32, no. 4, pp. 1079-1098, 2024
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]