Measurement of X-Ray Spectral Line Wavelengths by Using Two Bragg Reflections

Article type: Research Article

Authors: Rodé, A. V. | Maksimchuk, A. M. | Sklizkov, G. V. | Ridgeley, A. | Danson, C. | Rizvi, N. | Bann, R. | Forster, E. | Goetz, K. | Uschmann, I.

Affiliations: PN Lebedev Physical Institute, USSR | Rutherford Appleton Laboratory, Chilton, Didcot, Oxon OX11 0QX, United Kingdom | Friedrich-Schiller University, Jena, German Democratic Republic

Abstract: A novel method of measuring absolute x-ray wavelengths using simultaneous Bragg reflections at two parallel crystal plates of equal atomic spacing is presented. The accuracy of wavelength determination Δλ/λ for this method is discussed and a value of 5 × 10−5is achieved. Absolute wavelengths of L-shell laser-produced spectra of Cu, Ge, As, and Se and M-shell spectra of Gd and Tb have been measured in the wavelength region 7.5–8.5 Å using a quartz (10T0) quasimonolithic crystal blank.

DOI: 10.3233/XST-1990-2205

Journal: Journal of X-Ray Science and Technology, vol. 2, no. 2, pp. 149-159, 1990