Studies of Multilayers and Thin-Foil X-Ray Mirrors Using a Soft X-Ray Diffractometer

Article type: Research Article

Authors: Christensen, F. E. | Hornstrup, A. | Frederiksen, P. | Grundsøe, P. | Henrichsen, S. | Jacobsen, E. | Jonasson, P. | Madsen, M. M. | Nilsson, C. | Schnopper, H. W. | Westergaard, N. J. | Ørup, P.

Affiliations: Danish Space Research Institute, Gl. Lundtoftevej 7, DK-2800 Lyngby, Denmark

Abstract: A versatile x-ray diffractometer is described in detail. Two applications to the study of x-ray optical elements are presented. The first is a Bragg reflection study of state-of-the-art multilayers deposited both on conventional Si-wafer substrates and on superpolished substrates such as fused quartz and electroless nickel. These data are compared to data previously obtained at FeKα. The second study is a reflectivity and scattering study of various thin-foil x-ray reflectors proposed for up-coming x-ray satellite missions. All the data have been obtained at MgKα = 1.2536 keV.

DOI: 10.3233/XST-1990-2201

Journal: Journal of X-Ray Science and Technology, vol. 2, no. 2, pp. 81-94, 1990