Scanning Interferometer for the Measurement of Anomalous Dispersion with Synchrotron X Rays

Article type: Research Article

Authors: Bonse, U. | Lotsch, H. | Henning, A.

Affiliations: Institut für Physik, University of Dortmund, 4600 Dortmund, Federal Republic of Germany

Note: [] Present address: Siemens AG, 5810 Witten, Federal Republic of Germany.

Note: [] Also at HASYLAB/DESY, 2000 Hamburg, Federal Republic of Germany.

Abstract: We describe an x-ray interferometer optimized for operation with synchrotron radiation at the storage ring DORIS at DESY, Hamburg. Function principles, design, and manufacture are discussed. Interference fringes are created by scanning the analyzer crystal of the instrument in increments below 0.1 Å. Special attention is paid to minimize warping due to gravitational forces and disturbances from acoustic noise and ground vibration. The characteristics of two different monochromators with respect to harmonic rejection or harmonic selection and beam stability are considered. The instrument is best suited to the measurement of anomalous dispersion, for which an example is given.

DOI: 10.3233/XST-1989-1106

Journal: Journal of X-Ray Science and Technology, vol. 1, no. 1, pp. 107-120, 1989