Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Wang, Linyuan | Zhang, Hanming | Cai, Ailong | Li, Yongl | Yan, Bin | Li, Lei | Hu, Guoen
Affiliations: National Digital Switching System Engineering and Technological Research Center, Zhengzhou, Henan, China | He Nan Province People's Hospital, Zhengzhou, Henan, China
Note: [] Corresponding author: Bin Yan, National Digital Switching System Engineering and Technological Research Center, Zhengzhou 450002, Henan, China. E-mail: [email protected]
Abstract: Iterative image reconstruction (IIR) with sparsity-exploiting methods, such as total variation (TV) minimization, used for investigations in compressive sensing (CS) claim potentially large reductions in sampling requirements. Quantifying this claim for computed tomography (CT) is non-trivial, as both the singularity of undersampled reconstruction and the sufficient view number for sparse-view reconstruction are ill-defined. In this paper, the singular value decomposition method is used to study the condition number and singularity of the system matrix and the regularized matrix. An estimation method of the empirical lower bound is proposed, which is helpful for estimating the number of projection views required for exact reconstruction. Simulation studies show that the singularity of the system matrices for different projection views is effectively reduced by regularization. Computing the condition number of a regularized matrix is necessary to provide a reference for evaluating the singularity and recovery potential of reconstruction algorithms using regularization. The empirical lower bound is helpful for estimating the projections view number with a sparse reconstruction algorithm.
Keywords: System matrix analysis, sparse-view reconstruction, singularity, condition number, projection views number, total variation regularization
DOI: 10.3233/XST-140465
Journal: Journal of X-Ray Science and Technology, vol. 23, no. 1, pp. 1-10, 2015
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]