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Article type: Research Article
Authors: Mishra, Sourav; | Sharma, Kriti Sen; | Lee, Spencer J. | Fox, Edward A. | Wang, Ge
Affiliations: Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA | VT-WFU School of Biomedical Engineering and Sciences, Blacksburg, VA, USA | Department of Computer Science, Virginia Tech, Blacksburg, VA, USA
Note: [] Corresponding author: Sourav Mishra, Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA. E-mail: [email protected]
Abstract: Training on micro- and nano- computed tomography (CT) scanners has been traditionally conducted via extensive practice on the instrument. This entails presence of an instructor to guide through the training procedure, until reasonable experience is attained. Modern tomographic instruments being expensive to maintain, the operational costs escalates with increasing number of training conducted. In a pioneering approach, the technical know-how to operate such equipment has been partly imparted via virtual reality environment running on the Second Life grid. The experimentation has indicated a reduction of the total training time. The authors hope that in the long run, such techniques will aid in significant reduction of instruction time and costs associated with training.
Keywords: Virtual world, micro-CT, nano-CT, simulation, Second Life, CT (computed tomography), training
DOI: 10.3233/XST-2012-0332
Journal: Journal of X-Ray Science and Technology, vol. 20, no. 2, pp. 239-248, 2012
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