A new CT metal artifacts reduction algorithm based on fractional-order sinogram inpainting

Article type: Research Article

Authors: Zhang, Yi | Pu, Yi-Fei | Hu, Jin-Rong | Liu, Yan | Zhou, Ji-Liu

Affiliations: College of Computer Science, Sichuan University, Chengdu, China | School of Electronics And Information Engineering, Sichuan University, Chengdu, China

Note: [] Corresponding author: Yi Zhang, No. 24, south 1st part of 1st Ring Road, College of Computer Science, Sichuan University, Chengdu, 610065, China. Tel.: +86 13880621483; Fax: +86 028 86635137; E-mail: [email protected]

Abstract: In this paper, we propose a new metal artifacts reduction algorithm based on fractional-order total-variation sinogram inpainting model for X-ray computed tomography (CT). The numerical algorithm for our fractional-order framework is also analyzed. Simulations show that, both quantitatively and qualitatively, our method is superior to conditional interpolation methods and the classic integral-order total variation model.

Keywords: Metal artifacts reduction, image inpainting, total variation, fractional order, X-ray computed tomography

DOI: 10.3233/XST-2011-0300

Journal: Journal of X-Ray Science and Technology, vol. 19, no. 3, pp. 373-384, 2011